In this post, we will look at the book Semiconductors: Testing and Adjusting by G. Green and A Shokalsky.
About the book:
The book describes the working of many electronic devices and methods of testing them. Since the book was written in the early 70s, some of the technology presented in the book may be outdated.
The book was translated from the Russian by George Roberts and was first published by Mir in 1972.
PDF | OCR | Cover | Bookmarked | 210 pp. | 15 MB
The Internet Archive link for the book.
Contents
LIST OF SYMBOLS 5
Chapter One. RADIO PARTS. GENERAL 9
1.1. Resistors 9
1.2. Capacitors 13
1.3. Inductance Coils 17
1.4. Transformers and Low-Frequency Chokes 20
Review Questions 22
Chapter Two. TEMPERATURE MEASURING INSTRUMENTS 23
2.1. Non-Electrical Measurement of Temperature 23
2.2. Electrical Measurement of Temperature 28
Review Questions 37
Chapter Three. SEMICONDUCTOR DEVICES AND THEIR APPLICATIONS 38
3.1. General 38
3.2. Semiconductor Diodes 44
3.3. Transistors 55
3.4. Photodiodes, Phototransistors, Photoresistors, Phosphide Diodes, and Laser Diodes 64
Review Questions 67
Chapter Four. SEMICONDUCTOR TECHNOLOGY 68
4.1. Technological Cycle 68
4.2. Basic Methods of P-N Junction Formation 73
4.3. Equipment for P-N Junction Fabrication 78
4.4. Photolithographic Processing 81
4.5. Newly-Developed Methods of Semiconductor Production 82
4.6. Selection of Technological Method 85
4.7. Formation of Ohmic Contacts 86
4.8. Fabrication of Semiconductor Wafers and Crystals 88
4.9. Assembly of Medium-Power Junction Diffusion Diodes 90
4. 10. Assembly of High-Frequency Diffusion-Alloy Transistors 92
Review Questions 94
Chapter Five. Electrical Measuring Circuits 95
5.1. Graphical Representation of Measuring Circuit Elements 95
5.2. Rectifiers 97
5.3. Filters 101
5.4. Voltage stabilizers 103
5.5. Amplifiers 105
5.6. Multivibrators 108
5.7. Trigger Circuits 111
5.8. Comparators 113
5.9. Fundamentals of Logical Elements 115
5.10. Measuring Equipment and Wiring 119
5.11. Adjustment of Measuring Equipment 121
Review Questions 122
Chapter Six. Measurement of Electrical Parameters 124
6.1. Purpose and Methods of Measurement 124
6.2. Rectifier Diode Measurements 127
6.3. High-Frequency and Microwave Diodes Measurements 135
6.4. Pulse Diode Measurements 141
6.5. Reference Diode Measurements 142
6.6. Switching Diode Measurements 145
6.7. Transistor Measurements 150
6.8. Measurements of Varicap Diodes, Tunnel Diodes, Photodiodes, Phototransistors, and Photoresistors 160
6.9. Laser Diode Measurements 163
6.10. Automatic Measurements 166
Review Questions 171
Chapter Seven. Adjustment of Semiconductor Devices 172
7.1. Adjustment of Pulse Diodes 173
7.2. Adjustment of High-Frequency Diodes 174
7.3. Adjustment of Tunnel Diodes 175
7.4. Adjustment of Microwave Diodes 177
Review Questions 180
Chapter Eight. Testing Semiconductor Devices 181
8.1. Effect of Ambient Medium on Semiconductor Devices 181
8.2. Classification of Tests 182
8.3. Construction Tests 185
8.4. Electrical Tests 186
8.5. Mechanical Tests 192
8.6. Climatic Tests 195
Review Questions 200
Index 201
Mir Books 